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Metallography


Metallography (also called materialography) investigates Material structures quantitatively and qualitatively as well as microscopically and macroscopically.

A number of different methods and devices are available for this:

  • In an optical microscope, beams of light are reflected at various angles to make the material sample's surface structure visible. Dark-field technology (illumination virtually parallel to the surface) or a differential interference contrast (polarised light) can be used to increase the resolution if appropriate.
  • In a scanning electron microscope, varying numbers of secondary electrons are emitted from the samples' micro-surfaces in a rastered electron beam.
  • A transmission electron microscope can penetrate samples with a focused, highly accelerated electron beam, provided they are sufficiently thin. During this process, the electron beam is diverted / scattered at the material's atoms.
  • In ultrasonic microscopy, Sound waves penetrate the material with varying frequency. Phases in the sample volume can also be depicted.

Quantitative testing investigates various parameters:

  • The intercept method is used to determine grain size based on statistically representative samples.
  • The pore sizes (phase volume fractions) can be calculated and counted using a line grid.

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